High-density mark edge recording on a phase-change rewritable disk by a 680-nm laser diode

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Abstract
This paper reports a study of mark edge recording on the phase change rewritable disk. With the optical head using 680-nm laser diode and lens NA 0.6, 55 dB or higher carrier-to-noise ratio is obtained for signals whose recording mark length is 0.53 micrometers . In mark edge recording it is important to record all marks in their proper lengths. Hence, we first study shift behavior of the beginning and ending edges with regard to all marks, and then propose a new writing compensation method to make up for shifts. In the new compensation method the laser power modulation pattern consists of the first pulse, the multi-pulse chain and the last pulse. Adjusting the first and last pulse positions so that all marks are recorded in their proper lengths makes it possible to accomplish mark edge recording of the RLL (1,7) code with the linear density 0.4 micrometers /bit, jitter (sigma) /T(omega) to 6.5%. For the linear density of 0.35 micrometers /bit as well, a clear eye-pattern is obtained.

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