Observation of crystal defects using the scanning electron microscope
- 1 October 1971
- journal article
- other
- Published by Taylor & Francis in Philosophical Magazine
- Vol. 24 (190) , 973-979
- https://doi.org/10.1080/14786437108217061
Abstract
Preliminary pictures of some crystal defects are presented, taken in the scanning electron microscope, used both in the high-energy back-scattered mode and in the transmission mode.Keywords
This publication has 1 reference indexed in Scilit:
- Calculations of lattice defect images for scanning electron microscopyPhilosophical Magazine, 1971