High resolution frequency-domain reflectometry
- 1 April 1990
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. 39 (2) , 369-375
- https://doi.org/10.1109/19.52517
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
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