Combining high-resolution X-ray diffractometry and topography

• 1 April 1991
• journal article
• Published by International Union of Crystallography (IUCr) in Journal of Applied Crystallography
• Vol. 24  (2) , 178-183
• https://doi.org/10.1107/s0021889890013085

Abstract

Keywords

• TOPOGRAPHY
• HIGH RESOLUTION X
• RESOLUTION X RAY
• X RAY DIFFRACTOMETRY
• COMBINING HIGH