Sideband noise of a large phase carrier in interferometric sensors

24 September 1987

journal article
Published by Institution of Engineering and Technology (IET) in Electronics Letters

Vol. 23 (20) , 1062-1063
https://doi.org/10.1049/el:19870742

Abstract

Interferometric sensors using balanced detectors and phase stabilisation schemes remain susceptible to laser intensity noise if phase carrier techniques are employed. An intensity stability of 4 × 10⁻⁶ is required for the low-frequency side-band noise to be equivalent to microradian phase shift sensitivity if the phase carrier has a peak phase shift of π/2 rad.

Keywords

MICRORADIAN PHASE SHIFT SENSITIVITY
BALANCED DETECTORS
INTENSITY STABILITY
LOW-FREQUENCY SIDEBAND NOISE
LARGE PHASE CARRIER
PHASE STABILISATION SCHEMES
INTERFEROMETRIC SENSORS
LASER INTENSITY NOISE
FIBRE OPTIC SENSOR

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