Influence of strain in the reduction of the internal electric field in GaN/AlN quantum dots grown on a‐plane 6H‐SiC
- 6 June 2006
- journal article
- research article
- Published by Wiley in Physica Status Solidi (b)
- Vol. 243 (7) , 1499-1507
- https://doi.org/10.1002/pssb.200565103
Abstract
No abstract availableKeywords
This publication has 15 references indexed in Scilit:
- Reduction of the internal electric field in wurtzite a-plane GaN self-assembled quantum dotsApplied Physics Letters, 2005
- Optical properties of GaN quantum dots grown on nonpolar (11-20) SiC by molecular-beam epitaxyApplied Physics Letters, 2005
- GaN quantum dots grown on non‐polar a‐plane SiC by plasma‐assisted molecular beam epitaxyphysica status solidi (c), 2005
- Microstructural evolution of a-plane GaN grown on a-plane SiC by metalorganic chemical vapor depositionApplied Physics Letters, 2004
- Structure of GaN quantum dots grown under “modified Stranski–Krastanow” conditions on AlNJournal of Applied Physics, 2003
- Molecular-beam epitaxy of GaN/AlxGa1−xN multiple quantum wells on R-plane (101̄2) sapphire substratesApplied Physics Letters, 2002
- Theory of the electronic structure of GaN/AlN hexagonal quantum dotsPhysical Review B, 2000
- Blue-light emission from GaN self-assembled quantum dots due to giant piezoelectric effectPhysical Review B, 1998
- Elastic properties of zinc-blende and wurtzite AlN, GaN, and InNJournal of Applied Physics, 1997
- The determination of the elastic field of an ellipsoidal inclusion, and related problemsProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1957