Surface and bulk properties of TiO2 in relation to sensor applications

• 27 September 1988
• journal article
• Published by Elsevier in Solid State Ionics
• Vol. 28-30, 1423-1430
• https://doi.org/10.1016/0167-2738(88)90397-9

Abstract

Keywords

• POINT DEFECTS
• THIN FILMS
• SPECTROSCOPIC TECHNIQUES
• SEM
• SENSORS
• PROPERTIES OF TIO2
• AES
• BULK PROPERTIES