Electrical transport throughp-nandp-pheterostructures modulated by bound charges at a ferroelectric surface: Ferroelectricp-ndiode
- 1 May 1999
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 59 (17) , 11257-11266
- https://doi.org/10.1103/physrevb.59.11257
Abstract
Current through ferroelectrics on perovskite semiconductors is found to exhibit diode characteristics of which polarity is universally determined by the carrier conduction-type semiconductors. A persisting highly reproducible resistance modulation by a dc voltage, which has a short retention, is observed and is ascribed to a band bending of the ferroelectric by the formation of charged traps. This interpretation is consistent with a large relaxation current observed at a low voltage. On the other hand, a reproducible resistance modulation by a pulse voltage, which has a long retention, is observed in metal/ but not in metal/ and is attributed to a possible band bending due to the spontaneous polarization switching. The observed current voltage characteristics, the polarity dependence, the relaxation, and the modulation are explicable, if we assume a or a junction at the ferroelectric semiconductor interface (p: hole conduction type, n: electron conduction type). The analysis suggests that an intrinsically inhomogeneous P near the ferroelectric/metal interface is likely very weak or existing in a very thin layer, when a reaction of the metal with the ferroelectric is eliminated. Additionally, the various aspects of transport through ferroelectrics are explained as a transport in the carrier depleted region.
Keywords
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