Measurement Induced Localization from Spontaneous Decay
- 13 May 1996
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 76 (20) , 3683-3686
- https://doi.org/10.1103/physrevlett.76.3683
Abstract
We present a simulation method which localizes the atomic wave function each time a spontaneous photon is emitted. This allows a small set of basis states to be allocated dynamically to follow the atomic motion. We illustrate the application of this technique in a study of position jumps and quantum diffusion in the laser cooling of atoms.Keywords
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