Optical second-harmonic probe for silicon millimeter-wave circuits
- 18 March 1996
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 68 (12) , 1699-1701
- https://doi.org/10.1063/1.115910
Abstract
Electric field‐induced second‐harmonic generation (EFISHG) is shown to be a very powerful method for contactless sampling of high‐speed electrical signals on silicon millimeter‐wave devices. We present picosecond resolution EFISHG measurements of 2 GHz sinusoidal signals on a photoconductive silicon‐on‐sapphire antenna. We further demonstrate the application of the EFISHG technique for spatial mapping of free‐running microwave signals in silicon.Keywords
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