Fracture of Yttria‐Doped, Sintered Reaction‐Bonded Silicon Nitride
- 1 July 1985
- journal article
- Published by Wiley in Journal of the American Ceramic Society
- Vol. 68 (7) , 413-418
- https://doi.org/10.1111/j.1151-2916.1985.tb10155.x
Abstract
Flexural strength of an yttria‐doped, slip‐cast, sintered reaction‐bonded silicon nitride was evaluated as a function of temperature (20° to 1400°C in air), applied stress, and time. Static oxidation at 700o to 1400°C was investigated in detail; in tests at 1000°C in air, the material showed anomalous weight gain. Flexural stress‐rupture testing a 800° to 1200°C in air indicated that the material is susceptible to stress‐enhanced oxidation and early failure. Fractographic evidence for time‐dependent and ‐independent failures is presented.This publication has 4 references indexed in Scilit:
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