Bonding stress measurements from the degree of polarization of facet emission of AlGaAs superluminescent diodes
- 1 April 1991
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Quantum Electronics
- Vol. 27 (4) , 914-920
- https://doi.org/10.1109/3.83326
Abstract
No abstract availableThis publication has 32 references indexed in Scilit:
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