Magnetic force microscopy study of submicron track width recording in thin-film media

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Abstract
The magnetic force microscopy (MFM) technique is used to investigate the writing properties of a set of thin‐film heads with track widths ranging from 2 to 0.5 μm. MFM images show that track edge percolation occurs at lower densities than on‐track intertransition percolation. Track edge percolation results in track edge fluctuations and effective track width reduction. As the head track width is reduced to the near‐micron or submicron ranges, the track edges become dominant portions of the track and consequently cause severe degradation of the recording tracks. Track edge percolation is caused by a poor edge field gradient and is possibly enhanced by pole tip corner saturation. In order to achieve high‐density narrow track recording, high moment writing heads become necessary.

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