Scanning delay generator for measurement of kinetic decays using laser-induced fluorescence techniques

1 November 1982

journal article
Published by AIP Publishing in Review of Scientific Instruments

Vol. 53 (11) , 1786-1788
https://doi.org/10.1063/1.1136863

Abstract

An electronic device is described which generates a delayed pulse, where the delay is increased in a step-like manner. This device finds application in the measurement of kinetic decays, particularly when laser-induced fluorescent (LIF) detection of the decaying species is used. The circuit uses 15 low-power Schottky TTL chips and is contained within a dual width NIM module.

Keywords

ELECTROMAGNETIC RADIATION
INTEGRATED CIRCUITS
ELECTRONIC CIRCUITS
LUMINESCENCE
LOGIC CIRCUITS
LASER SPECTROSCOPY
FLUORESCENCE
CIRCUIT DESIGN
KINETIC ENERGY
CHIP
INTEGRATED CIRCUIT
KINETICS
SCHOTTKY DIODES
VIBRATION
CIRCUIT DIAGRAMS
LASER INDUCED FLUORESCENCE
DESIGN

This publication has 1 reference indexed in Scilit:

Excited state dynamics and bimolecular quenching processes for NH2(Ã2A1)
Chemical Physics, 1979