Coordination and Bond Character of Silicon and Aluminum Ions in Amorphous Thin Films in the System SiO2‐Al2O3
- 2 June 1982
- journal article
- Published by Wiley in Journal of the American Ceramic Society
- Vol. 65 (6) , c84-c86
- https://doi.org/10.1111/j.1151-2916.1982.tb10456.x
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- Densities of SiO2‐Al2O3 MeltsJournal of the American Ceramic Society, 1979
- Studies on Si-O bonding in silicate and aluminosilicate glasses based on SiK? emission X-raysJournal of Materials Science, 1978
- Studies on binary silicate glasses based on the SiKα and SiKß emission X-raysJournal of Non-Crystalline Solids, 1976
- Rapid Crystallization of SiO2‐Al2O3 GlassesJournal of the American Ceramic Society, 1973
- Studies of Chemical Bonding in Glasses by X‐Ray Emission SpectroscopyJournal of the American Ceramic Society, 1970
- Immiscibility and Crystallization in A12O3-SiO2GlassesJournal of the American Ceramic Society, 1969
- Chemical Bonding Studies of Silicates and Oxides by X-Ray K-Emission SpectroscopyJournal of Applied Physics, 1968
- Structure and Properties of Amorphous Silicoaluminas. I. Structure from X-Ray Fluorescence Spectroscopy and Infrared SpectroscopyThe Journal of Physical Chemistry, 1964
- Determining the Co-Ordination Number of Aluminium Ions by X-Ray Emission SpectroscopyNature, 1963