Nonlinear screening of negative point charges in diamond, silicon, and germanium
- 15 January 1982
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 25 (2) , 1362-1365
- https://doi.org/10.1103/physrevb.25.1362
Abstract
In the present paper we formulate a variational principle for obtaining approximate analytical solutions of a nonlinear differential equation established by Cornolti and Resta for the potentials of negative point charges embedded in pure diamond, silicon,and germanium. We consider the case of charges (in atomic units) in these semiconductors, while Cornolti and Resta considered the cases of . We find that our approximate analytical results for the spatial dielectric functions of diamond, silicon, and germanium, depending on , are in excellent agreement with the numerical results of Cornolti and Resta, who have presented their results in graphical form.
Keywords
This publication has 2 references indexed in Scilit:
- Nonlinear impurity screening in semiconductorsPhysical Review B, 1978
- Thomas-Fermi dielectric screening in semiconductorsPhysical Review B, 1977