Diffusional alloying in polycrystalline AgAl thin film couples studied by means of Kiessig X-ray interference
- 2 July 1979
- journal article
- Published by Elsevier in Surface Science
- Vol. 86, 68-74
- https://doi.org/10.1016/0039-6028(79)90380-7
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- An X-ray Optical Method for the Determination of Diffusion Properties in Very Thin Bimetallic FilmsZeitschrift für Naturforschung A, 1975
- Kinetics of phase formation in Au—A1 thin filmsPhilosophical Magazine, 1975
- Low temperature interdiffusion in copper-gold thin films analysed by helium back-scatteringThin Solid Films, 1973
- X-ray study of interdiffusion in bimetallic Cu–Au filmsJournal of Applied Physics, 1972
- Surface Studies of Solids by Total Reflection of X-RaysPhysical Review B, 1954