Influence of series and parallel transistors on DC characteristics of CMOS logic circuits

Publisher Website

31 December 1982

journal article
Published by Elsevier in Microelectronics Journal

Vol. 13 (2) , 25-30
https://doi.org/10.1016/s0026-2692(82)80193-6

Abstract

No abstract available

Keywords

This publication has 2 references indexed in Scilit:

Noise immunity of CMOS integrated circuits
Microelectronics Journal, 1979
Computer-aided design and characterization of digital MOS integrated circuits
IEEE Journal of Solid-State Circuits, 1969