X-ray-scattering study of the fast-ion conductor-alumina
- 15 December 1980
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 22 (12) , 5912-5923
- https://doi.org/10.1103/physrevb.22.5912
Abstract
The ion-ion correlations and a new crystal-structure determination of - and -alumina reveal that the conducting ions are distributed between two independent sites instead of one given by previous work: Beevers-Ross-anti-Beevers-Ross and mid-oxygen with an occupation ratio of 60% and 40%, respectively. The two-dimensional short-range order is found to correspond to a theoretical composition of 1.66 ions per unit plane cell. A relation is established between three parameters: the coherence length of the SRO model (), the thickness of the conduction slab (), and the resistivities (). It is shown that . The gradual change in the activation energies, observed for and when the temperature is increased, is interpreted in relation with the decrease of both and in the same temperature range. Finally, -alumina, when compared to -rich alumina with the same compensation mechanism and composition, exhibit higher conductivities due to larger conduction channels.
Keywords
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