Measurement of the Thickness of Thin Films by Multiple-Beam Interference
- 1 June 1956
- journal article
- Published by Springer Nature in Nature
- Vol. 177 (4518) , 1030-1031
- https://doi.org/10.1038/1771030a0
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Measurement of the Thickness of Thin Films by Multiple-Beam InterferometryProceedings of the Physical Society. Section B, 1951
- An Experimental Study of the Change in Phase Accompanying Reflection of Light from Thin Evaporated FilmsJournal of the Optical Society of America, 1950
- The Thickness Measurement of Thin Films by Multiple Beam InterferometryJournal of Applied Physics, 1950
- The Structure of Evaporated Metal Films and Their Optical PropertiesJournal of the Optical Society of America, 1950
- Interferometric Determination of the Apparent Thickness of Thin Metallic FilmsNature, 1949
- Studies on the Structure of Thin Metallic Films by Means of the Electron MicroscopeJournal of Applied Physics, 1943