A simple method for surface and ultrathin film characterization
- 1 April 1982
- journal article
- Published by Elsevier in Surface Science
- Vol. 116 (2) , 217-224
- https://doi.org/10.1016/0039-6028(82)90429-0
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- An electron spin polarization detector: Spin-dependent absorption of a polarized electron beamApplied Physics Letters, 1981
- An efficient low-energy electron-spin-polarization analyzerApplied Physics Letters, 1981
- SEM observations of caesium monolayers on polycrystalline tungstenSurface Science, 1981
- Adsorption and desorption of lead on low-index and stepped copper surfacesSurface Science, 1979
- Adsorption and surface alloying of lead monolayers on (111) and (110) faces of goldJournal of Physics F: Metal Physics, 1974
- Leed studies of the first stages of deposition and melting of lead on low index faces of copperSurface Science, 1972
- Secondary Electron EmissionPublished by Elsevier ,1948