X-ray diffraction data on U3Si
- 1 August 1971
- journal article
- Published by International Union of Crystallography (IUCr) in Journal of Applied Crystallography
- Vol. 4 (4) , 326-328
- https://doi.org/10.1107/s0021889871007088
Abstract
X-ray powder data for the compound U3Si have been obtained from an alloy prepared by arc melting uranium and silicon followed by a 7 day anneal at 800°C. The d spacing determinations have been extended into the back reflection to a 2θ value of 167.4 °. The observed relative intensities are compared with calculated values.Keywords
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