Soft x-ray and EUV efficiencies of CCDs
- 19 November 1993
- proceedings article
- Published by SPIE-Intl Soc Optical Eng
- p. 286-290
- https://doi.org/10.1117/12.162841
Abstract
We present a compilation of CCD quantum efficiency measurements made at soft x-ray and extreme ultraviolet wavelengths. The measurements include CCDs of varying architecture and have been obtained from a number of projects over the last several years.Keywords
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