X-ray fluorescence measurements of 412 inorganic compounds
- 9 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
In a search for new, fast, inorganic scintillators, 412 inorganic compounds have been exposed to 0.5-ns pulses of 20-keV X-rays and their fluorescent emissions have been measured. Most of these compounds were dense (>4 g/cm/sup 3/), contained heavy cations such as Pb, Bi, Ba, or a rare-earth element, and anions such as O, F, Cl, Br, I, CO/sub 3/, SO/sub 4/ and PO/sub 4/. About half were undoped compounds and half contained 0.1% to 10% rare-earth dopants. Standard scintillators such as BaF/sub 2/ and BGO were included for reference. The authors report total luminosities and fitted exponential decay times and percentages for 97 compounds having either a luminosity >40% of BGO, or an initial photon intensity greater than BGO, or a component decay timeKeywords
This publication has 5 references indexed in Scilit:
- X-ray fluorescence measurements of 412 inorganic compoundsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Scintillation properties of lead sulfateIEEE Transactions on Nuclear Science, 1992
- A method for measuring the time structure of synchrotron X-ray beamsNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1990
- Prospects for new inorganic scintillatorsIEEE Transactions on Nuclear Science, 1990
- Measurement of the Time Dependence of Scintillation Intensity by a Delayed-Coincidence MethodReview of Scientific Instruments, 1961