XPS STUDY OF SODIUM OXIDE IN AMORPHOUS SiO2
- 1 January 1978
- book chapter
- Published by Elsevier
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Electronic structure of Si, , and Ge from photoemission spectroscopyPhysical Review B, 1977
- Auger parameter in electron spectroscopy for the identification of chemical speciesAnalytical Chemistry, 1975
- FOURIER ANALYSIS OF X‐RAY PATTERNS OF SODA‐SILICA GLASS *Journal of the American Ceramic Society, 1938