Abstract
Studies of high resolution phosphor screens suitable for image intensifiers or small cathode ray tubes often require the MTF of the screens to be measured separately from the electron optics. Because electron excitation is essential for realistic measurement a demountable vacuum system is required if a usefully large number of screens are to be measured. These requirements have been met by combining a scanning electron microscope (SEM) with a standard MTF equipment. The screen is placed in the sample compartment of the SEM and a very fine line less than 2 μ;m wide is excited by the focussed beam of the SEM, deflected in the line direction only. The structure of the screen degrades the line and a specially designed optical system is used to relay an image of this degraded line from the SEM to the MTF analyser. Procedures used to ascertain the system response are described together with results from a variety of phosphor screens.© (1981) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.

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