Sample Preparation for Transmission Electron Microscopy of Germanium
- 1 August 1961
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 32 (8) , 889-891
- https://doi.org/10.1063/1.1717551
Abstract
Bulk samples of germanium have been reduced to sections thin enough for transmission electron microscopy. The apparatus and techniques of this virtual-electrode electrolytic etching process are described in detail with emphasis on the geometric control obtained. An example is given of an electron transmission micrograph of a 500-A-thick section.Keywords
This publication has 5 references indexed in Scilit:
- The direct observation of metallic surfaces in the electron microscopePhilosophical Magazine, 1959
- LXVIII. Direct observations of the arrangement and motion of dislocations in aluminiumPhilosophical Magazine, 1956
- Electrolytic Shaping of Germanium and SiliconBell System Technical Journal, 1956
- Micromachining with Virtual ElectrodesReview of Scientific Instruments, 1955
- Electron Microscope and Diffraction Study of Metal Crystal Textures by Means of Thin SectionsJournal of Applied Physics, 1949