Field-induced transfer of an atom between two closely spaced electrodes
- 15 June 1992
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 45 (23) , 13599-13606
- https://doi.org/10.1103/physrevb.45.13599
Abstract
The transfer of an adsorbed atom from one electrode to another in close proximity, with a potential difference between the electrodes, is analyzed theoretically. Calculations for the case of a Si atom are in accord with results on the transfer of Si atoms in the scanning tunneling microscope under ultrahigh-vacuum conditions at room temperature. Most of the activation-barrier lowering that permits a measurable transfer rate at this temperature is a chemical effect due to the proximity of the electrodes, but the bias provides an additional barrier lowering and a directional driving force. For conditions relevant to experiment, the atom acquires a distance-dependent charge no larger than several tenths of a unit charge (‖e‖).Keywords
This publication has 26 references indexed in Scilit:
- An atomic switch realized with the scanning tunnelling microscopeNature, 1991
- Field-Induced Nanometer- to Atomic-Scale Manipulation of Silicon Surfaces with the STMScience, 1991
- Atomic emission from a gold scanning-tunneling-microscope tipPhysical Review Letters, 1990
- Atomic scale desorption processes induced by the scanning tunneling microscopeThe Journal of Chemical Physics, 1990
- Theory of a single-atom point source for electronsPhysical Review Letters, 1989
- A self-consistent calculation of the tunneling barrier of metal-vacuum-metal junctions: Application to W-Vac-AuSurface Science, 1988
- Resistance of a one-atom contact in the scanning tunneling microscopePhysical Review B, 1987
- Theory of the bimetallic interfacePhysical Review B, 1985
- Theory of atomic chemisorption on simple metalsPhysical Review B, 1978
- Self-Consistent-Field Model of Bimetallic Interfaces. I. Dipole EffectsPhysical Review B, 1967