Bias Voltage Dependence of the Detected Voltage in MOM Devices
- 1 March 1985
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 24 (3R)
- https://doi.org/10.1143/jjap.24.375
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Mechanism and Properties of Point Contact W–Ni Diode Detectors at 10.6 µmJapanese Journal of Applied Physics, 1978
- Mechanism and properties of point-contact metal-insulator-metal diode detectors at 10.6 μApplied Physics Letters, 1974