Local stoichiometry and atomic interdiffusion during reactive metal/mercury–cadmium–telluride junction formation
- 1 September 1987
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology A
- Vol. 5 (5) , 3193-3197
- https://doi.org/10.1116/1.574836
Abstract
We summarize synchrotron radiation photoemission studies of Ag, Ge, and Sm overlayers on Hg1−xCdxTe(110) surfaces. These metals exhibit widely different interface reactivity with Hg1−xCdxTe and yield a range of different interface morphologies. To assess the relative importance of the microscopic driving forces that determine the local composition at the interface and in the semiconductor near-surface region we present a systematic comparison of our data with calculated thermodynamic parameters such as the cation–metal heat of solution, the heat of alloying from Miedema’s semiempirical model, and the metal–telluride formation enthalpy.Keywords
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