A Raman-atomic force microscope for apertureless-near-field spectroscopy and optical trapping
- 1 March 2002
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 73 (3) , 1198-1203
- https://doi.org/10.1063/1.1445864
Abstract
No abstract availableKeywords
This publication has 30 references indexed in Scilit:
- Progress in scanning probe microscopyActa Materialia, 2000
- Photothermal FT-IR Spectroscopy: A Step towards FT-IR Microscopy at a Resolution Better Than the Diffraction LimitApplied Spectroscopy, 1999
- Enhanced sensitivity near-field scanning optical microscopy at high spatial resolutionApplied Physics Letters, 1998
- Surface-enhanced Raman scatteringChemical Society Reviews, 1998
- Theory of Nanometric Optical TweezersPhysical Review Letters, 1997
- Probing Single Molecules and Single Nanoparticles by Surface-Enhanced Raman ScatteringScience, 1997
- Biased Diffusion, Optical Trapping, and Manipulation of Single Molecules in SolutionJournal of the American Chemical Society, 1996
- Optical Trapping and Manipulation of Viruses and BacteriaScience, 1987
- Atomic Force MicroscopePhysical Review Letters, 1986
- Surface Studies by Scanning Tunneling MicroscopyPhysical Review Letters, 1982