Influence of SrTiO3 bicrystal microstructural defects on YBa2Cu3O7 grain-boundary Josephson junctions
- 7 April 1997
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 70 (14) , 1882-1884
- https://doi.org/10.1063/1.118720
Abstract
Using near-field scanning optical microscopy (NSOM), we observe an inhomogeneous distribution of submicron-sized structural defects at the fusion boundary of polished SrTiO3 bicrystal substrates. Both NSOM and scanning force microscopy show that these substrate defects cause the grain boundary of a YBa2Cu3O7 thin film grown on the bicrystal to wander up to a micron in the film. These structural defects are shown to correlate qualitatively with the electrical characteristics of grain-boundary Josephson junctions patterned on the YBa2Cu3O7 film.Keywords
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