Thermal Characterization of Electronic Devices by Means of Improved Boundary Condition Independent Compact Models
- 1 January 1997
- book chapter
- Published by Springer Nature
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- DELPHI: The Development of Libraries of Physical Models of Electronic Components for an Integrated Design EnvironmentPublished by Springer Nature ,1995
- Pragmatic Methods for Determining the Parameters Required for the Thermal Analysis of Electronic SystemsPublished by Springer Nature ,1994
- Determination of the Weighted-Average Case Temperature for a Single Chip PackagePublished by Springer Nature ,1994