Scanning Probe Microscopy
- 1 January 1996
- journal article
- review article
- Published by American Chemical Society (ACS) in Analytical Chemistry
- Vol. 68 (12) , 185-230
- https://doi.org/10.1021/a1960008+
Abstract
No abstract availableThis publication has 735 references indexed in Scilit:
- Atomic Force Microscopy Study of Polystyrene Latex Film Morphology: Effects of Aging and AnnealingLangmuir, 1995
- Ordering and Adhesion of Latex Particles on Model Inorganic SurfacesLangmuir, 1995
- Native Escherichia coli OmpF Porin Surfaces Probed by Atomic Force MicroscopyScience, 1995
- Schreiben mit einzelnen MolekülenPhysikalische Blätter, 1995
- Molecular-Scale Structure of the Cation Modified Muscovite Mica Basal PlaneLangmuir, 1994
- Liquid-crystal alignment of phthalocyanine-derived Langmuir-Blodgett filmsApplied Physics B Laser and Optics, 1994
- Self-assembled monolayer film for enhanced imaging of rough surfaces with atomic force microscopyJournal of Applied Physics, 1994
- Anisotropic Friction at the Surface of Lamellar Crystals of Poly(oxymethylene) by Lateral Force MicroscopyLangmuir, 1994
- Atomic Force Microscopy of C60 Tethered to a Self-Assembled MonolayerLangmuir, 1994
- Distance measurements by atomic force microscopy on the angstrom scale: the effect of the specimen heightLangmuir, 1993