Single Event Upset in Combinatorial and Sequential Current Mode Logic

1 January 1985

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science

Vol. 32 (6) , 4216-4218
https://doi.org/10.1109/TNS.1985.4334097

Abstract

SEU testing of both combinatorial and sequential CML of identical technologies with Cf252 and Am241 heavy ion sources revealed agreement in the numbers of device disturbances in both categories of logic. The data confirms that terminal latch upset is primarily due to flip-flop toggling rather than by data path combinatorial logic disturbances.

Keywords

SINGLE EVENT UPSET
CIRCUIT TESTING
LOGIC TESTING
LOGIC DEVICES
ION SOURCES
FLIP-FLOPS
COUNTING CIRCUITS
STRIPS
SEQUENTIAL ANALYSIS
LATCHES