Ellipsometry for Modulated Reflection Studies of Surfaces*
- 1 May 1968
- journal article
- Published by Optica Publishing Group in Journal of the Optical Society of America
- Vol. 58 (5) , 700-701
- https://doi.org/10.1364/josa.58.000700
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 11 references indexed in Scilit:
- Transverse ElectroreflectancePhysical Review Letters, 1967
- Electric Field Effects on the Dielectric Constant of SolidsPhysical Review B, 1967
- Optical Field Effects and Band Structure of Some Perovskite-Type FerroelectricsPhysical Review B, 1967
- Piezoreflectivity of the Noble MetalsPhysical Review B, 1966
- Electroreflectance in MetalsPhysical Review Letters, 1966
- Reflectance modulation at a germanium surfaceSolid State Communications, 1966
- Electroreflectance Studies in GaAsJournal of Applied Physics, 1966
- Electroreflectance at a Semiconductor-Electrolyte InterfacePhysical Review Letters, 1965
- High-Sensitivity PiezoreflectivityPhysical Review Letters, 1965
- Franz-Keldysh Effect above the Fundamental Edge in GermaniumPhysical Review Letters, 1965