Computerized Pattern Recognition Applied to Ni‐Cd Cell Lifetime Prediction

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Abstract
Computerized pattern recognition was used to look for characteristics of new nickel‐cadmium spacecraft cells which would be predictive of later performance under stressful conditions. It was found that the changes in voltage while a cell was being charged could be used to make a rough estimate of its lifetime. The standard deviation in the predicted lifetime values was somewhat smaller than the standard deviation of the lifetime distribution as a whole, and there are indications that a more extensive data set would yield better results.

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