Stability of low-current break arcs between palladium contacts
- 1 May 1973
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 44 (5) , 2124-2129
- https://doi.org/10.1063/1.1662523
Abstract
The statistical distributions of break‐arc durations have been examined as functions of arc current and number of operations under both ``clean'' and contaminated conditions. Exponential distributions were found for arcs between clean palladium electrodes operating below 0.9 A. At higher currents a Gaussian‐ (normal) type distribution was observed. Under highly contaminated conditions the Gaussian distribution was observed at all current levels examined. These distributions have been discussed in terms of the ``ionic‐burst'' mechanism and thermionic emission. A model for the so‐called activation or arc‐duration enhancement of arcs is presented.This publication has 11 references indexed in Scilit:
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