Dependence of tunneling magnetoresistance on CoFe interfacial layer thickness in NiFe/Al/sub 2/O/sub 3//NiFe tunnel junctions
- 1 January 1999
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 35 (5) , 2919-2921
- https://doi.org/10.1109/20.801025
Abstract
No abstract availableKeywords
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