The Elimination of Tuning-Induced Burnout and Bias-Circuit Oscillations in IMPATT Oscillators
- 1 March 1973
- journal article
- website
- Published by Institute of Electrical and Electronics Engineers (IEEE) in Bell System Technical Journal
- Vol. 52 (3) , 271-306
- https://doi.org/10.1002/j.1538-7305.1973.tb01964.x
Abstract
IMPATT diode microwave oscillators suffer from the effects of low-frequency instabilities, which include excessive up-conversion of bias-circuit noise, bias-circuit oscillations, and diode burnout induced by tuning at the microwave frequency. These i...Keywords
This publication has 8 references indexed in Scilit:
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