IIIB-6 analysis of current transport and charge trapping in ultrathin nitrided oxide MIS capacitors
- 1 December 1984
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 31 (12) , 1972
- https://doi.org/10.1109/T-ED.1984.21854
Abstract
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