X-ray examinations of silicon monocrystals bombarded with ions
- 16 May 1972
- journal article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 11 (1) , K65-K67
- https://doi.org/10.1002/pssa.2210110156
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- X‐Ray Investigation of Lattice Deformations in Silicon Induced through High‐Energy Ion ImplantationPhysica Status Solidi (b), 1969
- X‐Ray Diffraction by a Crystal Containing a Translation FaultPhysica Status Solidi (b), 1969
- Range-energy relation for low energy protons in Si and GeNuclear Instruments and Methods, 1967
- Über eine röntgenographische Methode zur Untersuchung von Gitterstörungen an KristallenThe Science of Nature, 1931