An image method application to multilayer spreading resistance analysis
- 31 December 1977
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 20 (6) , 507-IN2
- https://doi.org/10.1016/s0038-1101(77)81007-1
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Spreading resistance correction factorsSolid-State Electronics, 1969
- Application of Multilayer Potential Distribution to Spreading Resistance Correction FactorsJournal of the Electrochemical Society, 1969
- Multilayer Theory of Correction Factors for Spreading-Resistance MeasurementsJournal of the Electrochemical Society, 1969
- Projected ranges of light ions in heavy substancesCanadian Journal of Physics, 1968
- The Analysis of Radiation Effects in Semiconductor Junction DevicesIEEE Transactions on Nuclear Science, 1967