Response of a correlated double sampling circuit to 1/f noise [generated in CCD arrays]
- 1 June 1980
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 15 (3) , 373-375
- https://doi.org/10.1109/jssc.1980.1051404
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Noise in buried channel charge-coupled devicesIEEE Journal of Solid-State Circuits, 1976
- Characterization of surface channel CCD image arrays at low light levelsIEEE Journal of Solid-State Circuits, 1974