RAPID ASSESSMENT OF VISUAL FUNCTION - ELECTRONIC SWEEP TECHNIQUE FOR THE PATTERN VISUAL EVOKED-POTENTIAL

  • 1 January 1979
    • journal article
    • research article
    • Vol. 18  (7) , 703-713
Abstract
An electronic spatial frequency sweep technique was developed for electrophysiological assessment of visual acuity and pattern vision. The technique allows an accurate and reliable measurement of VEP [visual evoked potential] to a full range of spatial frequencies in just 10 s. Because the measurements are so rapid, the technique suggests several new improvements in the assessment of visual function. Sweeping spatial frequency linearly and extrapolating the high-frequency region of the VEP spatial-turning function to 0 voltage allows an estimate of acuity which correlates highly with psychophysical estimates of acuity. Variants of the procedure are appropriate for the assessment of refractive error, determination of equality of visual function for the 2 eyes and of binocular interactions, and for sequential assessment of therapeutic conditions.