An integrated system for quantitative EDXRF analysis based on fundamental parameters
- 1 December 1990
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Vol. 299 (1-3) , 580-583
- https://doi.org/10.1016/0168-9002(90)90848-z
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
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