Structure investigation of the topmost layer of a thin ordered alumina film grown on NiAl(110) by low temperature scanning tunneling microscopy
- 13 June 2002
- journal article
- research article
- Published by Elsevier in Chemical Physics Letters
- Vol. 359 (1-2) , 41-47
- https://doi.org/10.1016/s0009-2614(02)00578-x
Abstract
No abstract availableKeywords
This publication has 23 references indexed in Scilit:
- Copper clusters on Al2O3/NiAl(110) studied with STMSurface Science, 2001
- Growth of thin, crystalline oxide, nitride and oxynitride films on metal and metal alloy surfacesSurface Science Reports, 2000
- Nucleation and growth of transition metals on a thin alumina filmSurface Science, 2000
- Palladium Nanocrystals on: Structure and Adhesion EnergyPhysical Review Letters, 1999
- Metal deposits on well-ordered oxide filmsProgress in Surface Science, 1999
- Introductory Lecture: Oxide surfacesFaraday Discussions, 1999
- Ultrathin metal films and particles on oxide surfaces: structural, electronic and chemisorptive propertiesPublished by Elsevier ,1998
- THE PHYSICAL AND CHEMICAL PROPERTIES OF ULTRATHIN OXIDE FILMSAnnual Review of Physical Chemistry, 1997
- Adsorption on oxide surfaces: structure and dynamicsSurface Science, 1994
- Formation of a well-ordered aluminium oxide overlayer by oxidation of NiAl(110)Surface Science, 1991