An improved Senarmont retardation analysis method
- 1 September 1985
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 139 (3) , 239-247
- https://doi.org/10.1111/j.1365-2818.1985.tb02640.x
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- The design and construction of a computer-compatible system to measure and record optical retardation with a polarizing or interference microscopeJournal of Microscopy, 1972
- Optical Compensators for Measurement of Elliptical PolarizationJournal of the Optical Society of America, 1948