TOWARD A TOMOGRAPHIC ATOM-PROBE

Abstract
The POSAP (Position Sensitive Atom Probe) has opened new outlooks for the three-dimensional analysis of materials with a resolution less than 1 nm. This paper presents a project for a Tomographic Atom Probe, based on the design of a multianode detector and the measurement of collected charges for each anode. The goal is to register the position and the time of flight for every ion even for simultaneous events

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