High-resolution x-ray scattering measurements: I. Surfaces
- 28 September 2000
- journal article
- Published by IOP Publishing in Reports on Progress in Physics
- Vol. 63 (10) , 1725-1777
- https://doi.org/10.1088/0034-4885/63/10/203
Abstract
X-ray scattering investigations of surfaces and interfaces in soft-condensed matter are reviewed. Both high-resolution structural determinations in the direct space and investigations of fluctuations with long-range correlations requiring a high resolution in the Fourier space are discussed. All the scattering cross-sections for diffraction or diffuse scattering are derived within a unified frame, and the experimental aspects related to their measurement are discussed in detail. The general principles are illustrated by various examples of studies of the liquid-vapour interface, Langmuir and Langmuir-Blodgett films, wetting films, polymer films, liquid crystals and liquid-liquid interfaces.Keywords
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